Business Analysis for Information Technology
Books and Selected Products
Happy About
August 2006
Paperback, 164 pages
ISBN: 1600050115

"In theory, test automation is supposed to be a silver bullet to increase test coverage and improve quality; offshoring is supposed to drastically cut costs. In reality, many organizations struggle with both, and don‘t see significant gains despite extensive efforts. This book clearly presents the challenges of test automation and a practical way for organizations of any size to overcome them to realize significant time and cost savings in their software testing effort. Every executive responsible for development and testing of software should become familiar with these ideas!"Bruce Martin, Vice President, Product Strategy, PSS Systems
"Offshoring by itself is not enough.This book provides you testing strategies to stay ahead of the competition and maximize your investment."Robert S. Alvin, CEO and Chairman, Netline Corporation
"Despite continued advances in development techniques and technologies, software quality problems are as pervasive as ever. Software testing teams are under tremendous pressure to test more complex systems with the same or fewer resources, and corporate managers are always looking to shave costs by leveraging offshore testing. This book does a great job of highlighting the fundamental challenges of software testing today, and then presents a thoughtful solution for leveraging test automation and offshoring to meeting your organizations quality goals."Adam Au, Vice President, Engineering, Centrify Corporation
"Automation isn‘t just about technical decisions. Finally, this book is the first that offers a practical business case for effective test automation."Michael Hatam, President, Application Services, Moyo Group
"This is one of the must read books by software executives. It goes over the major concepts and best practices of software testing in an efficient and effective manner. At Sun, we already use some of the best practices described in this book and are planning to adopt the remaining best practices."Satya Dodda, QA Director, J2EE App Server, Sun Micro Systems, Inc.
Mr. Nguyen is coauthor of the top–selling book in the software testing field, Testing Computer Software (Wiley, 2nd ed. 2002) and other publications including Testing Applications on the Web (Wiley, 2nd ed. 2003). His experience over the past two decades includes leadership roles in software development, quality, product and business management at Spinnaker, PowerUp, Electronic Arts, Palm Computing and other leading companies. A frequent speaker at industry events and a contributor to many industry publications, Nguyen also teaches software testing at LogiGear University, and at the University of California Berkeley Extension and Santa Cruz Extension in San Francisco and Silicon Valley.
Michael Hackett is co–founded LogiGear in 1994 and leads the company‘s LogiGear University training operations division, setting the standard in software testing education programs for many of the world‘s leading software development organizations. Mr. Hackett is coauthor of the popular Testing Applications on the Web (Wiley, 2nd ed. 2003), and has helped many clients produce, test and deploy applications ranging from business productivity to educational multimedia across multiple platforms and multiple language editions. His clients have included Palm Computing, Oracle, CNET, Electronics for Imaging, The Learning Company, and PC World.
Prior to co–founding LogiGear, Mr. Hackett managed QA teams at The Well, Adobe Systems, and PowerUp Software. He holds a Bachelor of Science in Engineering from Carnegie–Mellon University.
Brent K. Whitlock is currently a Program Manager at Digidesign, a division of Avid Technology, Inc. Prior to this, he was Director of Optical Systems Research and Business Development at RSoft Design Group, Inc., where he initiated and led the development and commercialization of several optical communication system simulation software packages including LinkSIM, ModeSYS, and OptSim 4, which won the Lightwave OFC/NFOEC 2005 Attendees Choice Award. He has also secured and served as Principal Investigator on federally funded SBIR, STTR, and NIST ATP research contracts.
Dr. Whitlock earned his BS, MS, and PhD all in Electrical Engineering from the University of Illinois at Urbana–Champaign. Dr. Whitlock has co–authored over 30 technical papers and articles. He is a Sr. Member of the IEEE and Chair of the Santa Clara Valley chapter of IEEE LEOS.